Measurement of hemispherical directional reflectance in the infrared

John Ternay Neu

doi:10.1117/12.162642

1 December 1993 Measurement of hemispherical directional reflectance in the infrared

John Ternay Neu

Proceedings Volume 1995, Optical Scattering: Applications, Measurement, and Theory II; (1993) https://doi.org/10.1117/12.162642
Event: SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation, 1993, San Diego, CA, United States

Abstract

This paper presents several types of surface optical property data provided directly and derived from an extended capability directional reflectometer. These data are required in a variety of scientific and industrial fields of research, development and testing including tailored coating development, support of remote sensing, ground truth investigations, thermal analysis, prediction of vehicle signatures, quality control of coatings and surfaces, and studies of geologic and biological sample study. A comparison of the commonly used experimental methods is provided. An explanation and documentation of the reasons for the inadequacy of IR diffuse gold integrating sphere directional reflectometers for most of the extended capability tasks is presented. Examples of data taken with an extended capability directional reflectometer are given. Progress on the development of fully automated, computer controlled hemi-ellipsoidal hemispherical directional reflectometers using a state-of-the-art FT-IR is noted. The sample measurement time from measurement start to printed results for the automated instrument will be less than 10% of the time required for the manual reflectometer.

Citation Download Citation

John Ternay Neu "Measurement of hemispherical directional reflectance in the infrared", Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); https://doi.org/10.1117/12.162642

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