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X-ray scattering at low angles demonstrates diffraction effects that can be used to characterize materials. The effects of overlying material are shown not to affect the usefulness of the data for the identification of explosives. The important features in the scattering signature are identified.
Robert D. Speller,Julie A. Horrocks, andRichard John Lacey
"X-ray scattering signatures for material identification", Proc. SPIE 2092, Substance Detection Systems, (28 March 1994); https://doi.org/10.1117/12.171256
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Robert D. Speller, Julie A. Horrocks, Richard John Lacey, "X-ray scattering signatures for material identification," Proc. SPIE 2092, Substance Detection Systems, (28 March 1994); https://doi.org/10.1117/12.171256