Paper
3 June 1994 Tunable IR diode lasers based on the A3B5 solid solution for the spectral range 2-4 μm
Yury P. Yakovlev, Alexej N. Baranov, Albert N. Imenkov, Andrei A. Popov, Victor V. Sherstnev
Author Affiliations +
Proceedings Volume 2112, Tunable Diode Laser Spectroscopy, Lidar, and DIAL Techniques for Environmental and Industrial Measurements; (1994) https://doi.org/10.1117/12.177319
Event: SPIE's International Symposium on Optical Sensing for Environmental Monitoring, 1993, Atlanta, GA, United States
Abstract
The structures and electroluminescence characteristics of new two types of single mode A3B5 semiconductor tunable lasers in the 1.8-3.9 micrometers spectral range have been demonstrated. The first type of tunable diode laser based on quaternary solid solutions GaInAsSb and GaAlAsSb lattice matched to GaSb substrate covers 1.8-2.4 micrometers spectral range. Such tunable 1.8-2.4 micrometers lasers have single mode or quasi-single mode operation in the wide temperature range from 1.6 to 300K. The second type of tunable diode laser based on multiple component InPAsSb/InAsSb lattice matched or mismatched to InAs substrate covers 2.8-3.9 micrometers spectral range, which was not available for diode laser spectroscopy until nowadays. Such tunable 2.8-3.9 micrometers lasers have CW single mode operation up to 100K and pulse operation up to 180K. These lasers can be the key devices for diode laser spectroscopy and sensitive detection of pollutants.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yury P. Yakovlev, Alexej N. Baranov, Albert N. Imenkov, Andrei A. Popov, and Victor V. Sherstnev "Tunable IR diode lasers based on the A3B5 solid solution for the spectral range 2-4 μm", Proc. SPIE 2112, Tunable Diode Laser Spectroscopy, Lidar, and DIAL Techniques for Environmental and Industrial Measurements, (3 June 1994); https://doi.org/10.1117/12.177319
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Cited by 2 scholarly publications.
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KEYWORDS
Semiconductor lasers

Laser damage threshold

Pulsed laser operation

Solids

Continuous wave operation

Heterojunctions

Temperature metrology

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