Paper
29 June 1994 Preparation and microstructure of epitaxial multilayers with infinite layer thin films
Toshifumi Satoh, Hideaki Adachi, Yoko Ichikawa, Kentaro Setsune, Kiyotaka Wasa
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Abstract
Epitaxial multilayer thin films of SrCuO2/(Sr,Ca)CuO2 and (Sr,Ca)CuO2/(Sr,Ca)RuO3 have been prepared on (100) SrTiO3 single crystal by a multitarget RF magnetron sputtering. The XRD measurements revealed that the heteroepitaxial growth of c-plane of the infinite-layer SrCuO2 or a-plane of perovskite (Sr,Ca)RuO3 was confirmed with c-plane of infinite-layer (Sr,Ca)CuO2 on (100) SrTiO3 substrate surface. Both multilayer films were successfully constructed as we designed with a minimum layer thickness of 10 angstroms. In the TEM images of the SrCuO2/(Sr,Ca)CuO2 multilayer, there existed planar dislocations being parallel to the ac- and bc-planes, crossing the boundaries of SrCuO2 and (Sr,Ca)CuO2 layers. On the other hand, TEM measurements of the (Sr,Ca)CuO2/(Sr,Ca)RuO3 multilayers indicated that there was no dislocation which exists commonly in the infinite-layer films. Resistivities of multilayer films at room temperature were ranging from 1 to 100 m(Omega) cm and showed semiconductor-like dependence against the temperature.
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Toshifumi Satoh, Hideaki Adachi, Yoko Ichikawa, Kentaro Setsune, and Kiyotaka Wasa "Preparation and microstructure of epitaxial multilayers with infinite layer thin films", Proc. SPIE 2157, Superconducting Superlattices and Multilayers, (29 June 1994); https://doi.org/10.1117/12.179180
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KEYWORDS
Multilayers

Modulation

Thin films

Perovskite

Satellites

Transmission electron microscopy

Diffraction

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