Paper
1 May 1994 Design of field electron emission spectrometer, field ion microscope, and field electron emission microscope combination
S. N. Ivanov, S. N. Shilimanov, Sergei I. Shkuratov
Author Affiliations +
Proceedings Volume 2259, XVI International Symposium on Discharges and Electrical Insulation in Vacuum; (1994) https://doi.org/10.1117/12.174564
Event: XVI International Symposium on Discharges and Electrical Insulation in Vacuum, 1994, Moscow-St. Petersburg, Russian Federation
Abstract
A new set up is described which allows one to carry out field electron microscopic and spectroscopic study of cathode surfaces in direct correlation with their atomic structure.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. N. Ivanov, S. N. Shilimanov, and Sergei I. Shkuratov "Design of field electron emission spectrometer, field ion microscope, and field electron emission microscope combination", Proc. SPIE 2259, XVI International Symposium on Discharges and Electrical Insulation in Vacuum, (1 May 1994); https://doi.org/10.1117/12.174564
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Microscopes

Spectroscopy

Ions

Niobium

Amplifiers

Manufacturing

Helium

Back to Top