Supercurrent distribution and flux penetration in high-Tc edge Josephson junctions

Mark Lee; Steven C. Gausepohl; Kookrin Char

doi:10.1117/12.250254

5 July 1996 Supercurrent distribution and flux penetration in high-T_c edge Josephson junctions

Mark Lee, Steven C. Gausepohl, Kookrin Char

Proceedings Volume 2697, Oxide Superconductor Physics and Nano-Engineering II; (1996) https://doi.org/10.1117/12.250254
Event: Photonics West '96, 1996, San Jose, CA, United States

Abstract

The spatial distribution of supercurrent in high-T_c Josephson junction devices has been studied extensively using field modulation measurements of the critical current and microwave absorption. The devices are edge junctions composed of YBa₂Cu₃O₇-YBa₂Co_0.21Cu_2.79O₇-YBa₂Cu₃O₇. The l_c(H) patterns allow a quantitative Fourier transform analysis to obtain a self-consistent spatial supercurrent density distribution, J_s(x). These junctions are found to be more homogeneous than in most other high-T_c Josephson junctions reported to date.

Citation Download Citation

Mark Lee, Steven C. Gausepohl, and Kookrin Char "Supercurrent distribution and flux penetration in high-T_c edge Josephson junctions", Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, (5 July 1996); https://doi.org/10.1117/12.250254

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