Using IDD to analyze analog faults and development of a sensor

Yvan Maidon; Yann Deval; Helene Fremont; Jean Paul Dom

doi:10.1117/12.250823

12 September 1996 Using IDD to analyze analog faults and development of a sensor

Yvan Maidon, Yann Deval, Helene Fremont, Jean Paul Dom

Proceedings Volume 2874, Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II; (1996) https://doi.org/10.1117/12.250823
Event: Microelectronic Manufacturing 1996, 1996, Austin, TX, United States

Abstract

The aim of this paper is a general survey of the test methods of analogue and mixed circuits, using a stimulus on the signal or power supply inputs, while the data came from the output current I_s or the power supply current I_DD. It insists on the fruitful measurement of I_DDQ, the dc power supply current, as well as the measurement of I_DDT, the transient power supply current. The design of a transducer has been performed. Its function is transparent because its power consumption is low and has no effect on the behavior of the circuit under test. This transducer is fast, accurate, linear and small for its possible duplication in the CUT. It can be inserted in mixed signal ASICs. Its performance in linearity and time domain allows us to exploit the advantages of the I_DD testing methods. This work is not a new approach of the fault detection but shows the application of new means for the static and dynamic measurements of I_DD.

Citation Download Citation

Yvan Maidon, Yann Deval, Helene Fremont, and Jean Paul Dom "Using IDD to analyze analog faults and development of a sensor", Proc. SPIE 2874, Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II, (12 September 1996); https://doi.org/10.1117/12.250823

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