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20 February 1998 Field electron emission from carbon-containing thin films
Jian Chen, A. X. Wei, H. Y. Zhang, Y. Lu, Xiangyang Zheng, Dang Mo, S. Q. Peng, N. S. Xu
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Proceedings Volume 3175, Third International Conference on Thin Film Physics and Applications; (1998) https://doi.org/10.1117/12.300687
Event: Third International Conference on Thin Film Physics and Applications, 1997, Shanghai, China
Abstract
Details are given of an experimental study of field electron emission phenomenon associated with two types of carbon containing thin film, i.e. non-doped fullerene C60 and amorphous diamond films. A transparent anode imaging technique was used to record the spatial distribution of individual emission sites and the total emission current-voltage (I-V) characteristic of the films. This study has revealed that stable electron emission can be obtained from both types of film at fields as low as 3 - 6 MV/m. A quasi-direct tunneling model is proposed to explain the observed emission.
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Jian Chen, A. X. Wei, H. Y. Zhang, Y. Lu, Xiangyang Zheng, Dang Mo, S. Q. Peng, and N. S. Xu "Field electron emission from carbon-containing thin films", Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, (20 February 1998); https://doi.org/10.1117/12.300687
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KEYWORDS
Thin films
Carbon
Diamond
Fullerenes
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