Paper
20 February 1998 Recent progress of multilayer ceramic capacitors
Takeshi Nomura
Author Affiliations +
Proceedings Volume 3175, Third International Conference on Thin Film Physics and Applications; (1998) https://doi.org/10.1117/12.300683
Event: Third International Conference on Thin Film Physics and Applications, 1997, Shanghai, China
Abstract
Recently, reduction of production costs with maintaining high reliability is required for wider applications of capacitors. Ni-electrode multilayer ceramic capacitors (MLCCs) of BaTiO3-based dielectrics and AgPd-electrode MLCCs of relaxor materials were developed to meet the requirements. Thinner dielectriclayers, miniaturization, and high capacitance are also major requirements for MLCCs. In these circumstances, much effort has been paid in order to achieve higher reliability. Ni-electrode MLCCs are promising way to satisfy the requirements of high capacitance, low cost, and high reliability. Major problems about the reliability were mechanical fracture, degradation of insulation resistance, and capacitance aging. These phenomena are strongly affected by both chemical composition and producing process.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Takeshi Nomura "Recent progress of multilayer ceramic capacitors", Proc. SPIE 3175, Third International Conference on Thin Film Physics and Applications, (20 February 1998); https://doi.org/10.1117/12.300683
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KEYWORDS
Capacitors

Ceramics

Reliability

Capacitance

Dielectrics

Resistance

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