Automatic Testing Of Infrared Detector Arrays

David A. Jones

doi:10.1117/12.933746

28 December 1982 Automatic Testing Of Infrared Detector Arrays

David A. Jones

Proceedings Volume 0344, Infrared Sensor Technology; (1982) https://doi.org/10.1117/12.933746
Event: 1982 Technical Symposium East, 1982, Arlington, United States

Abstract

Large scale infrared (IR) detector array production requires highly automated and accurate test equipment with data logging features. At Texas Instruments (TI), five different types of automatic test systems have been developed with a central computer data logging system. Two of these system types test the completed array in various stages of integration into the final assembly. These tests include responsivity, detectivity, and other characteristics. Since direct calibration for responsivity and detectivity is not available, close attention to the applicable formulas, an error budget, and calibration procedures is required. This paper first summarizes the many types of tests and test equipment that are used at TI in constructing a finished "Common Module" detector from raw mercury cadium telluride (MCT), then describes in more detail the test sets for automated testing of the array itself, and the factors affecting array test accuracy and calibration.

Citation Download Citation

David A. Jones "Automatic Testing Of Infrared Detector Arrays", Proc. SPIE 0344, Infrared Sensor Technology, (28 December 1982); https://doi.org/10.1117/12.933746

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