Minideflectometer for measuring optical finish quality

Willem D. van Amstel; Stefan M. B. Baumer; Fred C. M. Couweleers

doi:10.1117/12.360167

6 September 1999 Minideflectometer for measuring optical finish quality

Willem D. van Amstel, Stefan M. B. Baumer, Fred C. M. Couweleers

Proceedings Volume 3739, Optical Fabrication and Testing; (1999) https://doi.org/10.1117/12.360167
Event: Optical Systems Design and Production, 1999, Berlin, Germany

Abstract

The principle of scanning deflectometry is presented as a simple method for measuring optical figure finish quality of odd shaped high-gloss surfaces.

Citation Download Citation

Willem D. van Amstel, Stefan M. B. Baumer, and Fred C. M. Couweleers "Minideflectometer for measuring optical finish quality", Proc. SPIE 3739, Optical Fabrication and Testing, (6 September 1999); https://doi.org/10.1117/12.360167

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