Paper
4 November 1999 Polycrystallinity to epitaxy: AFM study of CdTe hydrothermal electrodeposition
Gennadiy V. Beketov
Author Affiliations +
Abstract
Atomic force microscopy has been used to investigate the topography of CdTe thin films grown by electrodeposition on monocrystalline substrates from aqueous solution of Cd and Te salts at elevated temperatures under overpressure. The surface morphology of the electrodeposited layers is found to be strongly effected by the temperature and the growth rates. Formation of flat terraced facets was observed for layers deposited at higher temperatures that allows to conclude the layer-by-layer growth mechanics. This gives an evidence to suggest that the epitaxial growth can be in principle realized on the base of the electrochemical deposition process.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gennadiy V. Beketov "Polycrystallinity to epitaxy: AFM study of CdTe hydrothermal electrodeposition", Proc. SPIE 3890, Fourth International Conference on Material Science and Material Properties for Infrared Optoelectronics, (4 November 1999); https://doi.org/10.1117/12.368395
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Cadmium

Atomic force microscopy

Tellurium

Epitaxy

Electrodes

Ions

Temperature metrology

Back to Top