Paper
6 November 2000 New interferometric method to measure the complete geometry of the keyhole
Muhammad Muddassir Gualini, Hans Steinbichler
Author Affiliations +
Proceedings Volume 4088, First International Symposium on Laser Precision Microfabrication; (2000) https://doi.org/10.1117/12.405754
Event: First International Symposium on Laser Precision Microfabrication (LPM2000), 2000, Omiya, Saitama, Japan
Abstract
PulsESPI, combined with an innovative beam deliver device, may enable obtaining a very accurate control sensor to determine with improved accuracy some of the laser material processing parameters like the geometry of the keyhole and cutting kerf in real time.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Muhammad Muddassir Gualini and Hans Steinbichler "New interferometric method to measure the complete geometry of the keyhole", Proc. SPIE 4088, First International Symposium on Laser Precision Microfabrication, (6 November 2000); https://doi.org/10.1117/12.405754
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KEYWORDS
Laser cutting

Interferometry

Laser processing

Mathematical modeling

Holography

Sensors

Control systems

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