Automated analysis of data mark microstructure of various media in the optical disk industry

Candi S. Cook; Donald A. Chernoff; David L. Burkhead

doi:10.1117/12.399345

18 September 2000 Automated analysis of data mark microstructure of various media in the optical disk industry

Candi S. Cook, Donald A. Chernoff, David L. Burkhead

Proceedings Volume 4090, Optical Data Storage 2000; (2000) https://doi.org/10.1117/12.399345
Event: Optical Data Storage, 2000, Whistler, BC, Canada

Abstract

We have developed a new technique for measuring pit geometry, track pitch, jitter and wobble on compact discs (CD) and digital versatile discs. This method uses direct physical inspection with a Atomic Force Microscope. The images are analyzed by our automated method and yield statistically robust results, so that process windows can be determined. In both types of media we report a variety of statistical parameters including mean and standard deviation and create trend charts and other graphs. In addition to the media previously mentioned we demonstrate imaging the data marks of a written CD-RW using surface potential.

Citation Download Citation

Candi S. Cook, Donald A. Chernoff, and David L. Burkhead "Automated analysis of data mark microstructure of various media in the optical disk industry", Proc. SPIE 4090, Optical Data Storage 2000, (18 September 2000); https://doi.org/10.1117/12.399345

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