Paper
25 January 2001 In-line thermal monitoring of acrylic surfaces processed by a segmented pixel drawing method using a slab rf-excited CO2 laser
Noriyo Sakurada, Masashi Iwamoto, Hajime Ebisutani, Yoshio Ishii, Kazuhiro Watanabe, Yuzuru Kubota
Author Affiliations +
Proceedings Volume 4184, XIII International Symposium on Gas Flow and Chemical Lasers and High-Power Laser Conference; (2001) https://doi.org/10.1117/12.414011
Event: XIII International Symposium on Gas Flow and Chemical Lasers and High-Power Laser Conference, 2000, Florence, Italy
Abstract
Visualization of thermal surfaces has been used in various fields. In this study, thermal monitoring of acrylic surfaces has been performed which were processed by a segmented pixel drawing (SPD) method using a slab-RF excited CO2 laser. The SPD method has been newly developed to make an artistic sculpture. In this method, it is possible to obtain various effects on processed surfaces by controlling processing parameters. This method demands uniform processing shapes in a pixel and reproducibility of results. The purposes of this study are to evaluate the processing results and to investigate the causes of unfavorable processing shapes by capturing thermal phenomena. Thermal distribution on laser processed surfaces obtained by this study can be useful to correct some important data for acrylic laser sculptures. The causes of unfavorable processing can be improved so as to obtain uniform processing shapes.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Noriyo Sakurada, Masashi Iwamoto, Hajime Ebisutani, Yoshio Ishii, Kazuhiro Watanabe, and Yuzuru Kubota "In-line thermal monitoring of acrylic surfaces processed by a segmented pixel drawing method using a slab rf-excited CO2 laser", Proc. SPIE 4184, XIII International Symposium on Gas Flow and Chemical Lasers and High-Power Laser Conference, (25 January 2001); https://doi.org/10.1117/12.414011
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KEYWORDS
Carbon dioxide lasers

Thermography

Computing systems

Image processing

Laser processing

Control systems

Infrared radiation

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