Development of a nondispersive UV-visible analyzer for simultaneous measurements of SO2 and NO2 in stacks emissions

Daniel C. Schinca; Gustavo Ratto; Fabian Videla; Edmundo J. Rodriguez; Roberto E. Di Paolo; Jorge O. Tocho

doi:10.1117/12.417382

13 February 2001 Development of a nondispersive UV-visible analyzer for simultaneous measurements of SO₂ and NO₂ in stacks emissions

Daniel C. Schinca, Gustavo Ratto, Fabian Videla, Edmundo J. Rodriguez, Roberto E. Di Paolo, Jorge O. Tocho

Author Affiliations +

Proceedings Volume 4201, Optical Methods for Industrial Processes; (2001) https://doi.org/10.1117/12.417382
Event: Environmental and Industrial Sensing, 2000, Boston, MA, United States

Abstract

12 Non-dispersive analyzers have been used for measurement of gases for many years and were recently introduced as on-line meters for continuous stack emission measurements in industrial plants. SO₂ and NO₂ are among the most important gases in the emissions of the petrochemical industry. The development of a UV-visible meter for these gases is presented. It consists of three optical channels sensing different spectral regions: 300 nm for SO₂, 380 nm for NO₂ and 320 nm used as a common reference. Each channel has an interference filter of 10 nm bandwidth centered at each channel's wavelength. Each filter is followed by a photodiode and its electronics which are housed in a single compartment with no moving parts. An incandescent lamp with high output in the UV region was selected and mounted on the opposite side of the stack by appropriate flanges. The equipment was designed to measure in the range between 0 and 500 ppmv with a resolution of about 2 ppmv. Performance parameters like signal stability, dark current, detection limit and calibration curves are shown.

Citation Download Citation

Daniel C. Schinca, Gustavo Ratto, Fabian Videla, Edmundo J. Rodriguez, Roberto E. Di Paolo, and Jorge O. Tocho "Development of a nondispersive UV-visible analyzer for simultaneous measurements of SO₂ and NO₂ in stacks emissions", Proc. SPIE 4201, Optical Methods for Industrial Processes, (13 February 2001); https://doi.org/10.1117/12.417382

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available