Heterojunction interfacial workfunction detectors for far-infrared applications

A. G. Unil Perera; S. G. Matsik; Viatcheslav Yu Letov; Hui Chun Liu; Aidong Shen; Ming Gao; Zbigniew R. Wasilewski; Margaret Buchanan; S. J. Rolfe

doi:10.1117/12.429422

12 June 2001 Heterojunction interfacial workfunction detectors for far-infrared applications

A. G. Unil Perera, S. G. Matsik, Viatcheslav Yu Letov, Hui Chun Liu, Aidong Shen, Ming Gao, Zbigniew R. Wasilewski, Margaret Buchanan, S. J. Rolfe

Author Affiliations +

Proceedings Volume 4288, Photodetectors: Materials and Devices VI; (2001) https://doi.org/10.1117/12.429422
Event: Symposium on Integrated Optics, 2001, San Jose, CA, United States

Abstract

Results are presented for a novel HEterojunction Interfacial Workfunction Internal Photoemission (HEIWIP) far-infrared detector with a cutoff wavelength of 70 micrometers . A responsivity of 10.5 A/W and a D* of approximately 10¹³ cm(root)Hz/W at 20 micrometers was achieved at 4.2 K. Dark current for the detectors was 2 orders of magnitude better than for homojunction interfacial workfunction internal photoemission (HIWIP) detectors at liquid helium temperatures. Capacitance measurements show similar behavior to other infrared photodetectors such as HIWIPs and QWIPs. The overall superior characteristics of HEIWIP detectors over HIWIP and QWIP detectors at longer wavelengths are of interest for future developments in far-infrared applications.

Citation Download Citation

A. G. Unil Perera, S. G. Matsik, Viatcheslav Yu Letov, Hui Chun Liu, Aidong Shen, Ming Gao, Zbigniew R. Wasilewski, Margaret Buchanan, and S. J. Rolfe "Heterojunction interfacial workfunction detectors for far-infrared applications", Proc. SPIE 4288, Photodetectors: Materials and Devices VI, (12 June 2001); https://doi.org/10.1117/12.429422

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