Linearization of Pt resistance temperature measurement circuit

Chuan-xiang Li

doi:10.1117/12.440221

14 September 2001 Linearization of Pt resistance temperature measurement circuit

Chuan-xiang Li

Proceedings Volume 4414, International Conference on Sensor Technology (ISTC 2001); (2001) https://doi.org/10.1117/12.440221
Event: International Conference on Sensing units and Sensor Technology, 2001, Wuhan, China

Abstract

A correction method for non-linear Pt resistance temperature measurement based on the principle of A/D conversion is introduced. The design principle of Pt resistance linear temperature measurement is analyzed and a new method for interfacing A/D converter with single chip computer 89c52 is provided together with the experimental data.

Citation Download Citation

Chuan-xiang Li "Linearization of Pt resistance temperature measurement circuit", Proc. SPIE 4414, International Conference on Sensor Technology (ISTC 2001), (14 September 2001); https://doi.org/10.1117/12.440221

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