Paper
8 May 2001 Lau phase interferometer for the measurement of the temperature and temperature profile of a gaseous flame
Author Affiliations +
Proceedings Volume 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001); (2001) https://doi.org/10.1117/12.427058
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '01), 2001, Yokohama, Japan
Abstract
In this paper we have investigated the utility of Lau phase interferometer with white light source and circular gratings to measure temperature and temperature profile of an axisymmetric flame. In Lau phase interferometer the two gratings are separated by infinite distance. The third grating is placed at a distance Z equals n.p2(lambda) , (where n is an integer, d is the pitch of the grating and (lambda) is the wavelength of the white light source). The sensitivity of the system is determined by the pitch 'p' of the grating and the distance Z between the gratings. If the distance Z between the two gratings is increased to enhance the sensitivity, the accuracy of measurement is reduced because of the reduction in the fringe contrast. In white light Lau phase interferometer the fringe contrast can be improved by optimizing the self-image plane and the pitch of the grating. From the recorded interferogram the angle of deflection ((phi) ) is measured and temperature at a different point of the flame is calculated. The temperature measured using Lau phase interferometer is in good agreement with the temperature measured by thermocouple and dataloger. Details of the theoretical analysis and experimental results are presented.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chandra Shakher and Madhuri Thakur "Lau phase interferometer for the measurement of the temperature and temperature profile of a gaseous flame", Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), (8 May 2001); https://doi.org/10.1117/12.427058
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Cited by 2 scholarly publications.
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KEYWORDS
Temperature metrology

Phase interferometry

Interferometers

Diffraction gratings

Interferometry

Light sources

Phase measurement

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