Paper
8 May 2001 Nondestructive evaluation of surface-subsurface-combined defects using photoacoustic microscope
Haruo Endoh, Naoto Yaegashi, Yoichiro Hiwatashi, Tsutomu Hoshimiya
Author Affiliations +
Proceedings Volume 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001); (2001) https://doi.org/10.1117/12.426995
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '01), 2001, Yokohama, Japan
Abstract
The imaging of the simulated surface-subsurface combined defect using photoacoustic microscope has been demonstrated. Simulated surface and subsurface defects are fabricated independently such that the former was drilled on a pure aluminum plate whereas the latter was machined with end mill. Specimen with subsurface defect alone was also carried out. The photoacoustic image obtained clearly showed the location and the size of both subsurface defect and the surface-subsurface combined defect. The photoacoustic method is useful for detection of the combined defect which is difficult to detect with present NDE techniques.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Haruo Endoh, Naoto Yaegashi, Yoichiro Hiwatashi, and Tsutomu Hoshimiya "Nondestructive evaluation of surface-subsurface-combined defects using photoacoustic microscope", Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), (8 May 2001); https://doi.org/10.1117/12.426995
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KEYWORDS
Nondestructive evaluation

Photoacoustic spectroscopy

Modulation

Phase shift keying

Microscopes

Diffusion

Defect detection

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