X-ray tomographic microscopy at the Swiss Light Source

Marco Stampanoni; Peter Wyss; Rafael Abela; Gunther L. Borchert; Detlef Vermeulen; Peter Ruegsegger

doi:10.1117/12.452868

7 January 2002 X-ray tomographic microscopy at the Swiss Light Source

Marco Stampanoni, Peter Wyss, Rafael Abela, Gunther L. Borchert, Detlef Vermeulen, Peter Ruegsegger

Proceedings Volume 4503, Developments in X-Ray Tomography III; (2002) https://doi.org/10.1117/12.452868
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

At the Material Science Beamline 4S of the Swiss Light Source (SLS), the X-ray Tomographic Microscopy (XTM) facility is entering its final construction phase. A high performance detector based on a scintillating screen optically coupled to a CCD camera has been developed and tested. MTF-responses of the detector system show spatial resolution down to the micrometer level. A second detector, which will provide a quantum jump in term of spatial resolution and efficiency, has been successfully simulated and will be integrated in the current device soon. A user- friendly graphical interface gives access to the main measurements parameters needed for a complete tomographic scan in absorption as well as in phase-contrast mode. The new instrumentation shall be used for the analysis of the physical structure and chemical composition of technical materials and biological samples, e.g. enabling non- destructive testing during the development of modern composite materials, or enabling pseudo-dynamic testing of bone samples to establish structure-function relationships in simulated osteoporosis.

Citation Download Citation

Marco Stampanoni, Peter Wyss, Rafael Abela, Gunther L. Borchert, Detlef Vermeulen, and Peter Ruegsegger "X-ray tomographic microscopy at the Swiss Light Source", Proc. SPIE 4503, Developments in X-Ray Tomography III, (7 January 2002); https://doi.org/10.1117/12.452868

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