Data analysis and calibration for a bulk-refractive-index-compensated surface plasmon resonance affinity sensor

Timothy M. Chinowsky; Sinclair S. Yee

doi:10.1117/12.456100

14 February 2002 Data analysis and calibration for a bulk-refractive-index-compensated surface plasmon resonance affinity sensor

Timothy M. Chinowsky, Sinclair S. Yee

Author Affiliations +

Proceedings Volume 4578, Fiber Optic Sensor Technology and Applications 2001; (2002) https://doi.org/10.1117/12.456100
Event: Environmental and Industrial Sensing, 2001, Boston, MA, United States

Abstract

Surface plasmon resonance (SPR) affinity sensing, the problem of bulk refractive index (RI) interference in SPR sensing, and a sensor developed to overcome this problem are briefly reviewed. The sensor uses a design based on Texas Instruments' Spreeta SPR sensor to simultaneously measure both bulk and surface RI. The bulk RI measurement is then used to compensate the surface measurement and remove the effects of bulk RI interference. To achieve accurate compensation, robust data analysis and calibration techniques are necessary. Simple linear data analysis techniques derived from measurements of the sensor response were found to provide a versatile, low noise method for extracting measurements of bulk and surface refractive index from the raw sensor data. Automatic calibration using RI gradients was used to correct the linear estimates, enabling the sensor to produce accurate data even when the sensor has a complicated nonlinear response which varies with time. The calibration procedure is described, and the factors influencing calibration accuracy are discussed. Data analysis and calibration principles are illustrated with an experiment in which sucrose and detergent solutions are used to produce changes in bulk and surface RI, respectively.

Citation Download Citation

Timothy M. Chinowsky and Sinclair S. Yee "Data analysis and calibration for a bulk-refractive-index-compensated surface plasmon resonance affinity sensor", Proc. SPIE 4578, Fiber Optic Sensor Technology and Applications 2001, (14 February 2002); https://doi.org/10.1117/12.456100

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available