Paper
21 October 2004 Characterization of a reflective spatial light modulator by determination of its Jones matrix
J. Andilla, Estela Martin-Badosa, Santiago Vallmitjana
Author Affiliations +
Proceedings Volume 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications; (2004) https://doi.org/10.1117/12.591964
Event: 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, 2004, Porlamar, Venezuela
Abstract
We propose a novel spatial light modulator (SLM) characterization method based on ellipsometric techniques, in which the Jones matrix describing the SLM polarization capabilities can be obtained and then used for any arbitrary configuration of the device. We have used it to characterize a reflecting SLM (analogue ferroelectric liquid crystal from Boulder Nonlinear Systems).
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J. Andilla, Estela Martin-Badosa, and Santiago Vallmitjana "Characterization of a reflective spatial light modulator by determination of its Jones matrix", Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); https://doi.org/10.1117/12.591964
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KEYWORDS
Spatial light modulators

Polarization

Modulators

Jones vectors

Complex systems

Ferroelectric LCDs

Modulation

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