Measurement and analysis of the variation of sidemode noise with cavity length for a semiconductor laser in an external grating cavity

C. E. Fairchild; D. H. McIntyre

doi:10.1117/12.609261

23 May 2005 Measurement and analysis of the variation of sidemode noise with cavity length for a semiconductor laser in an external grating cavity

C. E. Fairchild, D. H. McIntyre

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Proceedings Volume 5842, Fluctuations and Noise in Photonics and Quantum Optics III; (2005) https://doi.org/10.1117/12.609261
Event: SPIE Third International Symposium on Fluctuations and Noise, 2005, Austin, Texas, United States

Abstract

We report on an experiment to study the properties of nonlasing subthreshold sidemodes in a semiconductor laser operating in an external grating cavity configuration. We measure optical spectra consisting of the lasing mode and subthreshold nonlasing sidemodes, as well as radio frequency spectra at low frequency (0-100MHz) and at high frequency near the external grating cavity mode frequency. As the laser frequency is varied, the features of the rf spectra and the optical sidemode spectra all vary systematically. We present results on how these variations depend upon the external grating cavity mode frequency. Our results are compared with previous experiments and with theoretical predictions based upon four-wave mixing between the lasing mode and the adjacent sidemodes.

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C. E. Fairchild and D. H. McIntyre "Measurement and analysis of the variation of sidemode noise with cavity length for a semiconductor laser in an external grating cavity", Proc. SPIE 5842, Fluctuations and Noise in Photonics and Quantum Optics III, (23 May 2005); https://doi.org/10.1117/12.609261

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KEYWORDS

Semiconductor lasers

Four wave mixing

Laser damage threshold

Photodiodes

Radio optics

Ferroelectric materials

Gas lasers

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