Optical full-field measurement of strain at a microscopic scale with the grid method

Raphaël Moulart; René Rotinat; Fabrice Pierron; Gilles Lerondel; Pascal Royer

doi:10.1117/12.695991

15 September 2006 Optical full-field measurement of strain at a microscopic scale with the grid method

Raphaël Moulart, René Rotinat, Fabrice Pierron, Gilles Lerondel, Pascal Royer

Proceedings Volume 6341, Speckle06: Speckles, From Grains to Flowers; 63412U (2006) https://doi.org/10.1117/12.695991
Event: Speckle06: Speckles, From Grains to Flowers, 2006, Nimes, France

Abstract

In this work, a new micro-extensometric technique to study the local heterogeneities of strain fields in metallic alloys is introduced. It is based on the optical full-field measurement method called the grid method adapted to the micrometric scale. In the first part of the paper, the making of a periodic grating at the surface of the sample by direct interferometric photolithography is explained. The optimization of the grids in terms of phase noise is then addressed.

Citation Download Citation

Raphaël Moulart, René Rotinat, Fabrice Pierron, Gilles Lerondel, and Pascal Royer "Optical full-field measurement of strain at a microscopic scale with the grid method", Proc. SPIE 6341, Speckle06: Speckles, From Grains to Flowers, 63412U (15 September 2006); https://doi.org/10.1117/12.695991

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