Boundary-scan test system based on VXI bus

Ying Du; Wenyan Zhao; Quansheng Xi

doi:10.1117/12.717840

28 October 2006 Boundary-scan test system based on VXI bus

Ying Du, Wenyan Zhao, Quansheng Xi

Proceedings Volume 6358, Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation; 63581P (2006) https://doi.org/10.1117/12.717840
Event: Sixth International Symposium on Instrumentation and Control Technology, 2006, Beijing, China

Abstract

The boundary-scan technology is widely proposed as the main test method in coping with the growing complexity of Multi-chip modules (MCM) and PCBs. In this paper, the IEEE 1149.1 standard and the IEEE 1149.5 standard are introduced. The whole architecture and the relevant module design of the VXI boundary-scan test system are discussed. The test software compatible with the Boundary-scan Description Language (BSDL) files and the netlist files are developed under LabWindows/CVI. The test items of the system are introduced briefly. The actual test is performed on a multi-chip module.

Citation Download Citation

Ying Du, Wenyan Zhao, and Quansheng Xi "Boundary-scan test system based on VXI bus", Proc. SPIE 6358, Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation, 63581P (28 October 2006); https://doi.org/10.1117/12.717840

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