Paper
10 April 2007 New method for measurement of far IR beam intensity profile
Alexander A. Soloviev, Efim A. Khazanov, Ilya E. Kozhevatov, Oleg V. Palashov
Author Affiliations +
Abstract
A novel method for measuring the intensity profile of far-infrared radiation is presented. The idea is to measure nonstationary thermally induced variations in optical thickness of a target heated by the studied radiation. The optical thickness variations are observed by an interferometer. Beams with an aperture up to 60 mm may be measured with a spatial resolution of I mm.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander A. Soloviev, Efim A. Khazanov, Ilya E. Kozhevatov, and Oleg V. Palashov "New method for measurement of far IR beam intensity profile", Proc. SPIE 6613, Laser Optics 2006: Wavefront Transformation and Laser Beam Control, 661308 (10 April 2007); https://doi.org/10.1117/12.739349
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KEYWORDS
Spatial resolution

Silica

Interferometers

Optical testing

Sensors

Carbon dioxide lasers

Mirrors

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