A pre-processing method for the fringe image in phase measuring profilometry

Di Wu; Naiguang Lu

doi:10.1117/12.791500

5 March 2008 A pre-processing method for the fringe image in phase measuring profilometry

Di Wu, Naiguang Lu

Proceedings Volume 6623, International Symposium on Photoelectronic Detection and Imaging 2007: Image Processing; 66231A (2008) https://doi.org/10.1117/12.791500
Event: International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007, 2007, Beijing, China

Abstract

The measurement system currently used in Phase Measuring Profilometry(PMP) consists of a Digital Light Projector(DLP), a CCD camera, and a computer system. However, the inherent gamma nonlinearity of the DLP and CCD camera can affect the output with a nonsinusoidal fringe image. In the same tine the systematic noise is an important error source. Some conventional filtering algorithms may either make the fringe more blurring or be inefficient for fringe images. Eventually, the obtained fringe image is non-sinusoidal and with systematic random noise inevitably. Aimed at these problems, a pre-processing method for the fringe image is presented in this paper. Firstly, an anti-deforming light model is designed and then projected by the DLP. Through the gamma nonlinear response of the whole system, the waveform is corrected. Secondly, an improved orientation filter-based method is designed to overcome the systematic random noise and can achieve better effect than other algorithm does. Experiment, according to aforementioned two steps, is carried out and preferable fringe images can be gained. The fringe waveform is more close to the ideal sinusoidal wave. Also the systematic noise is reduced effectively while the fringe image is still clear. In the paper, two steps of this method are detailed and some experimental results are also reported.

Citation Download Citation

Di Wu and Naiguang Lu "A pre-processing method for the fringe image in phase measuring profilometry", Proc. SPIE 6623, International Symposium on Photoelectronic Detection and Imaging 2007: Image Processing, 66231A (5 March 2008); https://doi.org/10.1117/12.791500

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