Paper
19 February 2008 Spiral zone plate imaging for soft x-ray microscopy
Author Affiliations +
Abstract
Phase sensitive x-ray microscopy techniques are important in the study of samples that exhibit phase contrast. One way to detect these phase effects is to optically implement the radial Hilbert transform by using spiral zone plates (SZPs), resulting in the imaging of the amplitude and phase gradient in a sample. This is similar to differential interference contrast imaging in light microscopy. Soft x-ray microscopy using a SZP as a single element objective lens was demonstrated through the imaging of a 1 μm circular aperture at a wavelength of 2.73 nm. A regular zone plate, a charge 1 SZP, and a charge 2 SZP were fabricated on a silicon nitride membrane using electron beam lithography. The negative e-beam resist hydrogen silsesquioxane (HSQ) was used for patterning, and the zone plates were electroplated with nickel. These zone plates were then used as the imaging optic in a soft x-ray microscopy setup.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anne Sakdinawat and Yanwei Liu "Spiral zone plate imaging for soft x-ray microscopy", Proc. SPIE 6883, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics, 68830V (19 February 2008); https://doi.org/10.1117/12.769892
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Zone plates

X-ray microscopy

Spiral phase plates

Image filtering

Nickel

X-rays

Electron beam lithography

RELATED CONTENT

Beam shaping elements based on x ray refractive optics ...
Proceedings of SPIE (August 21 2020)
Scanning Soft X-Ray Microscopy
Proceedings of SPIE (July 12 1988)
Imaging microscopy with x-ray lasers at LLNL
Proceedings of SPIE (January 13 1993)
Soft x-ray microscope with zone plates at UVSOR
Proceedings of SPIE (January 13 1993)
Fabrication Technology And Applications Of Zone Plates
Proceedings of SPIE (July 28 1989)

Back to Top