Application of local cluster neural network to detect structure analysis of semi-insulating GaAs

Stanisław Jankowski; Tomasz Piotr Pichlak

doi:10.1117/12.784708

28 December 2007 Application of local cluster neural network to detect structure analysis of semi-insulating GaAs

Stanisław Jankowski, Tomasz Piotr Pichlak

Proceedings Volume 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007; 69371V (2007) https://doi.org/10.1117/12.784708
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 2007, Wilga, Poland

Abstract

This paper prsents a method of detection of deep defect centres in semi-insulating materials, with usage of neural net application. Innovation of this work is based on implementation of local cluster activation function in standard scheme of neural network.

Citation Download Citation

Stanisław Jankowski and Tomasz Piotr Pichlak "Application of local cluster neural network to detect structure analysis of semi-insulating GaAs", Proc. SPIE 6937, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2007, 69371V (28 December 2007); https://doi.org/10.1117/12.784708

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