Localized surface plasmon microscope employing a beam scanning method

Kouyou Watanabe; Goro Terakado; Hiroshi Kano

doi:10.1117/12.810066

28 August 2008 Localized surface plasmon microscope employing a beam scanning method

Kouyou Watanabe, Goro Terakado, Hiroshi Kano

Proceedings Volume 7033, Plasmonics: Nanoimaging, Nanofabrication, and Their Applications IV; 703329 (2008) https://doi.org/10.1117/12.810066
Event: NanoScience + Engineering, 2008, San Diego, California, United States

Abstract

We propose a localized surface plasmon microscope that uses a zeroth-order Bessel beam for the illumination to employ a beam scanning method. The microscope visualizes the refractive index distribution in the optical near-field from a substrate surface by measuring the coupling strength between illumination light and surface plasmons from the light absorption. The beam scanning method utilizing a galvano mirror for the fast scanning axis increases the repetition rate up to 2 kHz. In order to confirm imaging properties of the developed microscope, we observe the point spread function by using a latex particle with the diameter of 175nm. It is revealed that the properties of the observed point spread function coincide with that of the calculated intensity distribution of the electric field.

Citation Download Citation

Kouyou Watanabe, Goro Terakado, and Hiroshi Kano "Localized surface plasmon microscope employing a beam scanning method", Proc. SPIE 7033, Plasmonics: Nanoimaging, Nanofabrication, and Their Applications IV, 703329 (28 August 2008); https://doi.org/10.1117/12.810066

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KEYWORDS

Surface plasmons

Microscopes

Refractive index

Bessel beams

Particles

Latex

Metals

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