Online analysis of sulfur in diesel line by a monochromatic wavelength dispersive x-ray fluorescence spectrometry

Eduardo Pérez-Careta; Juan Antonio López-Ramírez; Gilberto Reynoso-Whitaker; Javier Sánchez-Mondragon; Miguel Torres-Cisneros

doi:10.1117/12.848957

3 December 2009 Online analysis of sulfur in diesel line by a monochromatic wavelength dispersive x-ray fluorescence spectrometry

Eduardo Pérez-Careta, Juan Antonio López-Ramírez, Gilberto Reynoso-Whitaker, Javier Sánchez-Mondragon, Miguel Torres-Cisneros

Author Affiliations +

Proceedings Volume 7499, Seventh Symposium Optics in Industry; 74991E (2009) https://doi.org/10.1117/12.848957
Event: Seventh Symposium on Optics in Industry, 2009, Guadalajara, Jalisco, Mexico

Abstract

This paper proposes the application of a monochromatic wavelength dispersive X-ray fluorescence (MWDXRF) technique developed in the X-ray Optical Systems laboratory Inc. The technique measures low-level sulfur (uls) in fuel. Data for ultra low sulfur in diesel were collected and analyzed using the combination of the mentioned technique and the usage of engineering tools as a fastloop array and a measurement technique. This provides a qualitative method for Diesel sulfur analysis of the Refinery Ing. Antonio M Amor (RIAMA) in Salamanca, Guanajuato. The pooled limit of quantification (PLOQ) for ultra-low-sulfur diesel was found to be less than 1.5 ppm in this study. The reproducibility of 15-ppm sulfur diesel fuel was determined to be better than 3 ppm (95 % confident level). This work shows the performance of the production of Diesel with less than 15-ppm in sulfur lines in the Hydrodesulfurizer Unit of Diesel (HDD) of the refinery. Results and conclusions discusses the better and cheaper method for the production of ultra low sulfur Diesel in the refinery.

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Eduardo Pérez-Careta, Juan Antonio López-Ramírez, Gilberto Reynoso-Whitaker, Javier Sánchez-Mondragon, and Miguel Torres-Cisneros "Online analysis of sulfur in diesel line by a monochromatic wavelength dispersive x-ray fluorescence spectrometry", Proc. SPIE 7499, Seventh Symposium Optics in Industry, 74991E (3 December 2009); https://doi.org/10.1117/12.848957

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