Study on reliability enhancement testing for InSb focal plane array detector

Meng Chao; Peng Jing; Ma Wei

doi:10.1117/12.900272

8 September 2011 Study on reliability enhancement testing for InSb focal plane array detector

Meng Chao, Peng Jing, Ma Wei

Proceedings Volume 8193, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications; 819322 (2011) https://doi.org/10.1117/12.900272
Event: International Symposium on Photoelectronic Detection and Imaging 2011, 2011, Beijing, China

Abstract

InSb focal plane array (FPA) detectors which are important components of infrared systems have great influence on systems' reliability and development. Few researches have been focused on this field in recent years. Therefore, it is rather essential to carry out reliability test. In the paper, reliability enhancement testing has been carried out on 128×128 elements InSb FPA detectors to discuss the influence of temperature stresses and vibration stresses on structure and performance. Working boundary conditions of InSb FPA detectors were obtained. Aiming at the failure the corresponding improvements were adopted, and reliability of detector was enhanced greatly.

Citation Download Citation

Meng Chao, Peng Jing, and Ma Wei "Study on reliability enhancement testing for InSb focal plane array detector", Proc. SPIE 8193, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications, 819322 (8 September 2011); https://doi.org/10.1117/12.900272

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