Spectral response and SNR analysis of an Offner imaging spectrometer

Zhen-zhou Wu; Zhi-hong Ma

doi:10.1117/12.900932

18 August 2011 Spectral response and SNR analysis of an Offner imaging spectrometer

Zhen-zhou Wu, Zhi-hong Ma

Proceedings Volume 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications; 81942W (2011) https://doi.org/10.1117/12.900932
Event: International Symposium on Photoelectronic Detection and Imaging 2011, 2011, Beijing, China

Abstract

The Signal-to-Noise Ratio (SNR) is an important quantitative parameter for evaluating the capability of spectrometers. The noises of CMOS image sensor, stray light and radiometric distortion play important roles in the spectrometer's SNR performance. An Offner imaging spectrometer is designed and tested. By measuring the spectrometer's spectral response, its SNR is calculated by the traditional statistical method and the wavelet analysis. Both methods give similar result and can provide useful information during the spectrometer commissioning as well as performance evaluation.

Citation Download Citation

Zhen-zhou Wu and Zhi-hong Ma "Spectral response and SNR analysis of an Offner imaging spectrometer", Proc. SPIE 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, 81942W (18 August 2011); https://doi.org/10.1117/12.900932

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