Paper
30 November 2011 Metrology on absolute fluorescence quantum efficiency for solid materials
Guojin Feng, Yu Wang, Ping Li, Tingting Guo
Author Affiliations +
Proceedings Volume 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 82010Z (2011) https://doi.org/10.1117/12.903431
Event: International Conference on Optical Instruments and Technology (OIT2011), 2011, Beijing, Beijing, China
Abstract
High-precision measurement for fluorescence quantum efficiency of solid materials has been a very cumbersome and complex process. In recent years, though many scholars have done a lot of studies, the relative and simplified measurement are mainly been emphasised on, and it is very difficult to obtain the accurate measurement uncertainty. Refering to NRC, on the basis of the little appropriate transformation on commercial instruments, this paper introduces the absolute quantum efficiency measurement for solid materials, based on double monochromator method. Currently, the measuring wavelength covers 250-800nm, the uncertainty of quantum efficiency is about 5%(k=2) .
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Guojin Feng, Yu Wang, Ping Li, and Tingting Guo "Metrology on absolute fluorescence quantum efficiency for solid materials", Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010Z (30 November 2011); https://doi.org/10.1117/12.903431
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KEYWORDS
Quantum efficiency

Solids

Luminescence

Monochromators

Calibration

Sensors

Metrology

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