Paper
15 November 2011 Intensity error correction for 3D shape measurement based on phase-shifting method
Tien-Tung Chung, Meng-Hung Shih
Author Affiliations +
Proceedings Volume 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation; 83213P (2011) https://doi.org/10.1117/12.905370
Event: Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 2011, Yunnan, China
Abstract
3D shape measurement based on structured light system is a field of ongoing research for the past two decades. For 3D shape measurement using commercial projector and digital camera, the nonlinear gamma of the projector and the nonlinear response of the camera cause the captured fringes having both intensity and phase errors, and result in large measurement shape error. This paper presents a simple intensity error correction process for the phase-shifting method. First, a white flat board is projected with sinusoidal fringe patterns, and the intensity data is extracted from the captured image. The intensity data is fitted to an ideal sine curve. The difference between the captured curve and the fitted sine curve are used to establish an intensity look-up table (LUT). The LUT is then used to calibrate the intensities of measured object images for establishing 3D object shapes. Research results show that the measurement quality of the 3D shapes is significantly improved.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tien-Tung Chung and Meng-Hung Shih "Intensity error correction for 3D shape measurement based on phase-shifting method", Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213P (15 November 2011); https://doi.org/10.1117/12.905370
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication and 1 patent.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
3D metrology

Phase shifts

Calibration

Error analysis

Projection systems

Fringe analysis

Cameras

Back to Top