Paper
13 January 2012 Defect density: a review on the calculation of size program
Nurdatillah Hasim, Aedah Abd Rahman
Author Affiliations +
Abstract
Defect density is a measurement conducted in one of Malaysia's ICT leading company. This paper will be discussing on issues of defect density measurement. Regarding defects counted, in order to calculate defect density, we also need to consider the total size of product that is the system size. Generally, defect density is a measure of the number of total defect found divided by the size of the system measured. Therefore, the system size is measured by lines of code. Selected projects in the company have been identified and GeroneSoft Code Counter Pro V1.32 is used as tool to count the lines of code. To this end, the paper presents method used. Analyzed defect density data are represented using control chart because shows the capability of the process so that the achievable goal can be set.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nurdatillah Hasim and Aedah Abd Rahman "Defect density: a review on the calculation of size program", Proc. SPIE 8350, Fourth International Conference on Machine Vision (ICMV 2011): Computer Vision and Image Analysis; Pattern Recognition and Basic Technologies, 835037 (13 January 2012); https://doi.org/10.1117/12.920991
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Computer programming

Computer programming languages

C++

Java

Lab on a chip

Statistical analysis

Excel

RELATED CONTENT

A CORBA event system for ALMA common software
Proceedings of SPIE (September 15 2004)
A survey on open source software testing tools a...
Proceedings of SPIE (January 13 2012)
Protyping machine vision software on the World Wide Web
Proceedings of SPIE (October 06 1998)
XBI: a Java-based interface to FPGA hardware
Proceedings of SPIE (October 08 1998)

Back to Top