Study on the nonlinear polarization rotation law in a bulk semiconductor optical amplifier in a pump-probe scheme

Xianghua Feng; Jiarong Ji; Wenhua Dou; Guomin Zhang

doi:10.1117/12.978253

15 October 2012 Study on the nonlinear polarization rotation law in a bulk semiconductor optical amplifier in a pump-probe scheme

Xianghua Feng, Jiarong Ji, Wenhua Dou, Guomin Zhang

Author Affiliations +

Proceedings Volume 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing; 84200I (2012) https://doi.org/10.1117/12.978253
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

The physical mechanisms for the polarization rotation of the light in a bulk semiconductor optical amplifier (SOA) originate from the significant nonuniform distributions of carrier density across the active region. Due to this carrier density’s nonuniformity, the effective refractive indexes experienced by transverse-electric (TE) and transverse-magnetic (TM) modes of the probe are different. This results in a phase shift between TE and TM modes of the light upon leaving the SOA. The bulk SOA polarization rotation’s law can be analyzed theoretically and experimentally based on the method of measuring output power in a pump-probe scheme. The experiment employs polarizer driving by walking electromotor and power meter, the light power of every orientation is measured. The transformation law of output polarization is find for obvious polarization rotation in other perpendicular axes based on connection of ellipse in difference axes.

Citation Download Citation

Xianghua Feng, Jiarong Ji, Wenhua Dou, and Guomin Zhang "Study on the nonlinear polarization rotation law in a bulk semiconductor optical amplifier in a pump-probe scheme", Proc. SPIE 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing, 84200I (15 October 2012); https://doi.org/10.1117/12.978253

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