Converting surface roughness data into PSD and BSDF

Richard N. Pfisterer

doi:10.1117/12.931671

15 October 2012 Converting surface roughness data into PSD and BSDF

Richard N. Pfisterer

Proceedings Volume 8495, Reflection, Scattering, and Diffraction from Surfaces III; 849505 (2012) https://doi.org/10.1117/12.931671
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

The process to convert raw profilometer data describing surface roughness into PSD and BSDF is discussed, but not well-documented in the open optical engineering literature, and is therefore prone to procedural mistakes. This paper describes the step-by-step numerical process as well as the three "check points" that insure that errors have not been introduced into the calculation. A numerical example is discussed.

Citation Download Citation

Richard N. Pfisterer "Converting surface roughness data into PSD and BSDF", Proc. SPIE 8495, Reflection, Scattering, and Diffraction from Surfaces III, 849505 (15 October 2012); https://doi.org/10.1117/12.931671

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