Bayesian approach of laser-induced damage threshold analysis and determination of error bars

Gintarė Batavičiutė; Povilas Grigas; Linas Smalakys; Andrius Melninkaitis

doi:10.1117/12.976315

4 December 2012 Bayesian approach of laser-induced damage threshold analysis and determination of error bars

Gintarė Batavičiutė, Povilas Grigas, Linas Smalakys, Andrius Melninkaitis

Proceedings Volume 8530, Laser-Induced Damage in Optical Materials: 2012; 85301S (2012) https://doi.org/10.1117/12.976315
Event: SPIE Laser Damage, 2012, Boulder, Colorado, United States

Abstract

In this study the applicability of commonly used Damage Frequency Method (DFM) is addressed in the context of Laser-Induced Damage Threshold (LIDT) testing. A simplified computer model representing the statistical interaction between laser irradiation and randomly distributed damage precursors is applied for Monte Carlo experiments. The reproducibility of LIDT predicted from DFM is examined under both idealized and realistic laser irradiation conditions by performing numerical 1-on-1 tests. A widely accepted linear fitting resulted in systematic errors when estimating LIDT and its error bars. For the same purpose a Bayesian approach was proposed. A novel concept of parametric regression based on varying kernel and maximum likelihood fitting technique is introduced and studied. Such approach exhibited clear advantages over conventional linear fitting and led to more reproducible LIDT evaluation. Furthermore LIDT error bars are obtained as a natural outcome of parametric fitting which exhibit realistic values. The proposed improvements are of practical importance in LIDT metrology.

Citation Download Citation

Gintarė Batavičiutė, Povilas Grigas, Linas Smalakys, and Andrius Melninkaitis "Bayesian approach of laser-induced damage threshold analysis and determination of error bars", Proc. SPIE 8530, Laser-Induced Damage in Optical Materials: 2012, 85301S (4 December 2012); https://doi.org/10.1117/12.976315

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