Spectral-domain interferometry for quantitative DIC microscopy

Chengshuai Li; Yizheng Zhu

doi:10.1117/12.2040541

12 March 2014 Spectral-domain interferometry for quantitative DIC microscopy

Chengshuai Li, Yizheng Zhu

Proceedings Volume 8949, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI; 89491D (2014) https://doi.org/10.1117/12.2040541
Event: SPIE BiOS, 2014, San Francisco, California, United States

Abstract

A spectral-domain differential interference contrast (SD-DIC) microscopy system is presented for quantitative imaging of both reflective and transparent samples. The spectral-domain interferometry, combined with the common-path DIC geometry, provides a shot noise-limited sensitivity of 14.3pm in optical pathlength gradient measurement. The optical resolution of the system was characterized using images of a USAF resolution target. Fused silica microspheres were imaged to demonstrate the reconstruction of two-dimensional optical pathlength topography from measured gradient fields. The exquisite sensitivity of the system showed potential in quantitative imaging of sub-diffraction limit objects such as gold nanoparticles.

Citation Download Citation

Chengshuai Li and Yizheng Zhu "Spectral-domain interferometry for quantitative DIC microscopy", Proc. SPIE 8949, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI, 89491D (12 March 2014); https://doi.org/10.1117/12.2040541

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