The design of color spectrophotometer based on diffuse illumination and compatible SCE/SCI geometric condition

Kun Yuan; Hui-min Yan; Shang-zhong Jin

doi:10.1117/12.2036508

19 December 2013 The design of color spectrophotometer based on diffuse illumination and compatible SCE/SCI geometric condition

Kun Yuan, Hui-min Yan, Shang-zhong Jin

Author Affiliations +

Proceedings Volume 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 90460V (2013) https://doi.org/10.1117/12.2036508
Event: International Conference on Optical Instruments and Technology (OIT2013), 2013, Beijing, China

Abstract

The geometric conditions of diffuse illumination, 8 degree observation, specular light include (SCI) and specular light exclude (SCE) often be employed to measure the surface color of material with different gloss value. The SCE condition is usually realized by setting light trap on the integrating sphere. However, the structure of light trap has its negative influence on the light intensity uniformity, and can led to the inaccuracy of the test results under SCE or SCI condition. Due to the different sizes of the light trap, structures of the measurement instrument will led to inter instrument agreement among the measurement of sample with different gloss. This paper designs a measuring structure to measure the SCE and SCI results simultaneously; proposes a method to calculate the 8 degree gloss value based on the SCE and SCI test result; proposes a computing modal to modify the SCI and SCE measure result based on the 8 degree gloss value, experimental verifying is also carried out. The experimental results demonstrate the structure and modified model effectively reduce the negative influence of light trap. The inter instrument disagreement caused by the geometric dimension of different
light trap is significantly decreased.

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Kun Yuan, Hui-min Yan, and Shang-zhong Jin "The design of color spectrophotometer based on diffuse illumination and compatible SCE/SCI geometric condition", Proc. SPIE 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 90460V (19 December 2013); https://doi.org/10.1117/12.2036508

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KEYWORDS

Integrating spheres

Instrument modeling

Calibration

Spectrophotometry

Coating

Color difference

Data modeling

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