Multiple-wave diffraction in x-ray interferometers

Mykola Raransky; Vitaliy Balazyuk; Mykola Melnyk; Olga Kniginitska; Mykhailo Gunko; Maria Kshevetska

doi:10.1117/12.2053240

17 December 2013 Multiple-wave diffraction in x-ray interferometers

Mykola Raransky, Vitaliy Balazyuk, Mykola Melnyk, Olga Kniginitska, Mykhailo Gunko, Maria Kshevetska

Proceedings Volume 9066, Eleventh International Conference on Correlation Optics; 90661B (2013) https://doi.org/10.1117/12.2053240
Event: Eleventh International Conference on Correlation Optics, 2013, Chernivsti, Ukraine

Abstract

Analysis of multiple-wave diffraction in multi-unit X-ray interferometers is made. Geometry of multiple-wave diffractions and X-ray reflection factors Rm (t) are analyzed. Experimental moiré patterns for the case of LLLinterferometer at (000, 220, 022) diffraction are obtained. The advantages of multiple-wave diffraction in the determination of displacement and strain vector components as well the Burgers vector components are highlighted.

Citation Download Citation

Mykola Raransky, Vitaliy Balazyuk, Mykola Melnyk, Olga Kniginitska, Mykhailo Gunko, and Maria Kshevetska "Multiple-wave diffraction in x-ray interferometers", Proc. SPIE 9066, Eleventh International Conference on Correlation Optics, 90661B (17 December 2013); https://doi.org/10.1117/12.2053240

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