Paper
26 August 2015 Memristor memory element based on ZnO thin film structures
A. R. Poghosyan, E. Y. Elbakyan, R. Guo, R. K. Hovsepyan
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Abstract
The memristor element for random access memory (resistance random access memory - ReRAM) was developed and investigated. The developed structure consists of a Schottky diode (1D) based on Pt/ZnO:Ga/ZnO/Pt heterostructure and a memristor (1R) based on Pt/ZnO:Ga/ZnO/ZnO:Li/Pt heterostructure. Thus the unipolar memristor memory element of 1D1R type was obtained. The heterostructures were produced by the electron-beam vacuum deposition method. The laboratory samples of the memory elements were prepared and their characteristics were studied. The proposed device has a high stability and withstands 1000 switching cycles without derating.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. R. Poghosyan, E. Y. Elbakyan, R. Guo, and R. K. Hovsepyan "Memristor memory element based on ZnO thin film structures", Proc. SPIE 9586, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IX, 95861C (26 August 2015); https://doi.org/10.1117/12.2190111
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Cited by 2 scholarly publications.
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KEYWORDS
Zinc oxide

Diodes

Heterojunctions

Switching

Lawrencium

Thin films

Chemical elements

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