Presentation
5 October 2023 Near zero field magnetoresistance spectroscopy in solid state electronic devices
Author Affiliations +
Abstract
A very simple class of measurements based upon interactions of pairs of electrons called near zero field magnetoresistance (NZFMR) spectroscopy has much of the analytical power of much more complex electron paramagnetic techniques in identifying the physical and chemical nature of point defects which play important roles in the operation of a wide variety of solid state devices. We show that this very simple measurement can provide information about hyperfine interactions with dominating defects in technologically important devices.
Conference Presentation
(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Patrick Lenahan, Elias Frantz, Sean King, Fedor Sharov, Stephen Moxim, Kenneth Myers, Nicholas Harmon, and Michael Flatte "Near zero field magnetoresistance spectroscopy in solid state electronic devices", Proc. SPIE PC12656, Spintronics XVI, PC126561U (5 October 2023); https://doi.org/10.1117/12.2678025
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KEYWORDS
Spectroscopes

Field spectroscopy

Solid state electronics

Semiconductors

Electrons

Field effect transistors

Measurement devices

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