An inexpensive open-source solution for dual rotating variable angle reflective ellipsometer (VARE)

Enkui Lian; John de Mello

doi:10.1117/12.2692578

13 March 2024 An inexpensive open-source solution for dual rotating variable angle reflective ellipsometer (VARE)

Enkui Lian, John de Mello

Proceedings Volume PC12832, Optics and Biophotonics in Low-Resource Settings X; PC1283201 (2024) https://doi.org/10.1117/12.2692578
Event: SPIE BiOS, 2024, San Francisco, California, United States

Abstract

We describe an inexpensive, open-source rotating polariser, rotating analyser variable angle reflective ellipsometer (VARE), suitable for measuring the generalised ellipsometric angles of anisotropic materials. With a build cost of $800 and substantial scope for customisation, the instrument offers functionality typically associated with far costlier commercial instruments. Phase alignment of the rotating polarisers is achieved by a phase-locked loop, while the ellipsometric angles are determined by Fourier analysis of the reflected signal, using an integrated microcontroller-based lock-in amplifier. The performance of the instrument is compared against a high-end commercial instrument.

Conference Presentation

Citation Download Citation

Enkui Lian and John de Mello "An inexpensive open-source solution for dual rotating variable angle reflective ellipsometer (VARE)", Proc. SPIE PC12832, Optics and Biophotonics in Low-Resource Settings X, PC1283201 (13 March 2024); https://doi.org/10.1117/12.2692578

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