Phase-only spatial light modulators (SLMs) are extensively utilized for controlling the phase of light in diverse applications. However, liquid-crystal-on-silicon (LCOS) SLMs exhibit undesired spatial variations in both phase response and optical flatness across the SLM panel, which necessitates calibration for achieving accurate phase control. Here, we propose a rapid and straightforward calibration approach to address these non-uniformities at the single-pixel level. Our method leverages Twyman-Green interferometry without relying on a piezoelectric transducer, significantly reducing the measurement time to approximately 4.5 seconds by collecting only 18 interferograms of SLM patterns with constant gray levels. This remarkable speed ensures minimal vulnerability to environmental disturbances during interferometry. We provide a comprehensive description of the calibration procedure, evaluate the performance of the calibrated local pixel response, and validate the flatness calibration using SLM-based phase shift interferometry.
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