Page 113, Back Matter

Table of Contents

• Front Matter

• Introduction
• Electromagnetic Spectrum

• Infrared Concepts

• Optics
• Imaging Concepts

• Magnification Factors

• Thick Lenses

• Stop and Pupils

• F-number and Numerical Aperture

• Field-of-View

• Combination of Lenses

• Afocal Systems and Refractive Telescopes

• Cold-Stop Efficiency and Field Stop

• Image Quality

• Image Anomalies in Infrared Systems

• Infrared Materials

• Material Dispersion

• Atmospheric Transmittance

• Radiometry and Sources
• Solid Angle

• Radiometry

• Radiometric Terms

• Flux Transfer

• Flux Transfer for Image-Forming Systems

• Source Configurations

• Blackbody Radiators

• Planck's Radiation Law

• Stefan-Boltzmann and Wien's Displacement Laws

• Rayleigh-Jeans and Wien's Radiation Laws

• Exitance Contrast

• Emissivity

• Kirchhoff's Law

• Emissivity of Various Common Materials

• Radiometric Measure of Temperature

• Collimators

• Performance Parameters for Optical Detectors
• Infrared Detectors

• Primary Sources of Detector Noise

• Noise Power Spectral Density

• White Noise

• Noise-Equivalent Bandwidth

• Shot Noise

• Signal-to-Noise Ratio: Detector and BLIP Limits

• Generation-Recombination Noise

• Johnson Noise

• 1/f Noise and Temperature Noise

• Detector Responsivity

• Spectral Responsivity

• Blackbody Responsivity

• Noise Equivalent Power

• Specific or Normalized Detectivity

• Photovoltaic Detectors or Photodiodes

• Sources of Noise in PV Detectors

• Expressions for DPV,BLIP∗, DPV,BLIP∗∗, and DPV,JOLI∗

• Photoconductive Detectors

• Sources of Noise in PC Detectors

• Pyroelectric Detectors

• Bolometers

• Bolometers: Immersion Optics

• Thermoelectic Detectors

• Infrared Systems
• Raster Scan Format: Single-Detector

• Multiple-Detector Scan Formats: Serial Scene Dissection

• Parallel Scene Dissection

• Staring Systems

• Search Systems and Range Equation

• Noise Equivalent Irradiance

• Performance Specification: Thermal-Imaging Systems

• MTF Definitions

• Optics MTF: Calculations

• Electronics MTF: Calculations

• MTF Measurement Setup and Sampling Effects

• MTF Measurement Techniques: PSF and LSF

• MTF Measurement Techniques: ESF and CTF

• MTF Measurement Techniques: Noiselike Targets

• MTF Measurement Techniques: Interferometry

• Noise Equivalent Temperature Difference

• NETD Measurement Technique

• Minimum Resolvable Temperature Difference

• MRTD: Calculation

• MRTD Measurement Technique

• MRTD Measurement: Automatic Test

• Johnson Criteria

• Infrared Applications

• Appendix
• Equation Summary

• Back Matter