SUBSCRIPTIONS & PRICING
GENERAL INFORMATION
Page 93, Back Matter
Published: 28 September 2006
Chapter DOI: http://dx.doi.org/10.1117/3.702897.bm
Chapter Page Count: 10
pages
Table of Contents
- Fundamentals of Interferometry
- Two-Beam Interference Equation
- Interferometers
- The Interferometer
- Interferograms
- Interferograms
- Phase-Shifting Interferometry
- Direct Phase Measurement
- Surface Microstructure
- Surface Microstructure
- Flat Surface Testing
- Flat Surface Testing
- Curved Surface Testing
- Testing Curved Surfaces-Test Plate
- Absolute Measurements
- Absolute Measurements: Flats
- Asphere Testing
- Aspheric Surfaces
- Appendices
- Non-Interferometric Testing
Excerpt
This back matter contains the equation summary, bibliography, index, and author biographies.
©2006 Society of Photo-Optical Instrumentation Engineers











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