Page 7, Total Internal Reflection

Table of Contents

• Front Matter

• Basic Concepts
• The Nature of Light

• The Spectrum of Microscopy

• Wave Equations

• Wavefront Progagation

• Optical Path Length (OPL)

• Laws of Reflection and Refraction

• Total Internal Reflection

• Evanescent Wave in Total Internal Reflection

• Propagation of Light in Anisotropic Media

• Polarization of Light and Polarization States

• Coherence and Monochromatic Light

• Interference

• Contrast vs Spatial and Temporal Coherence

• Contrast of Fringes (Polarization and Amplitude Ratio)

• Multiple Wave Interference

• Interferometers

• Diffraction

• Diffraction Grating

• Useful Definitions from Geometrical Optics

• Image Formation

• Magnification

• Stops and Rays in an Optical System

• Aberrations

• Chromatic Aberrations

• Spherical Aberration and Coma

• Astigmatism, Field Curvature, and Distortion

• Performance Metrics

• Microscope Construction
• The Compound Microscope

• The Eye

• Upright and Inverted Microscopes

• The Finite Tube Length Microscope

• Infinity-Corrected Systems

• Telecentricity of a Microscope

• Magnification of a Microscope

• Numerical Aperture

• Resolution Limit

• Useful Magnification

• Depth of Field and Depth of Focus

• Magnification and Frequency vs Depth of Field

• Kohler Illumination

• Alignment of Kohler Illumination

• Critical Illumination

• Stereo Microscopes

• Eyepieces

• Nomenclature and Marking of Objectives

• Objective Designs

• Special Objectives and Features

• Special Lens Components

• Cover Glass and Immersion

• Common Light Sources for Microscopy

• LED Light Sources

• Filters

• Polarizers and Polarization Prisms

• Specialized Techniques
• Amplitude and Phase Objects

• The Selection of a Microscopy Technique

• Image Comparison

• Phase Contrast

• Visibility in Phase Contrast

• The Phase Contrast Microscope

• Characteristic Features of Phase Contrast

• Amplitude Contrast

• Oblique Illumination

• Modulation Contrast

• Hoffman Contrast

• Dark Field Microscopy

• Optical Staining: Rheinberg Illumination

• Optical Staining: Dispersion Staining

• Shearing Interferometry: The Basis for DIC

• DIC Microscope Design

• Appearance of DIC Images

• Reflectance DIC

• Polarization Microscopy

• Images Obtained with Polarization Microscopes

• Compensators

• Confocal Microscopy

• Scanning Approaches

• Images from a Confocal Microscope

• Fluorescence

• Configuration of a Fluorescence Microscope

• Images from Fluorescence Microscopy

• Properties of Fluorophores

• Single vs Multi-Photon Excitation

• Light Sources for Scanning Microscopy

• Practical Considerations in LSM

• Interference Microscopy

• Optical Coherence Tomography/Microscopy

• Optical Profiling Techniques

• Optical Profilometry: System Design

• Phase-Shifting Algorithms

• Resolution Enhancement Techniques
• Structured Illumination: Axial Sectioning

• Structured Illumination: Resolution Enhancement

• TIRF Microscopy

• Solid Immersion

• Stimulated Emission Depletion

• STORM

• 4Pi Microscopy

• The Limits of Light Microscopy

• Other Special Techniques
• Raman and CARS Microscopy

• SPIM

• Array Microscopy

• Digital Microscopy and CCD Detectors
• Digital Microscopy

• Principles of CCD Operation

• CCD Architectures

• CCD Noise

• Signal-to-Noise Ratio and the Digitization of CCD

• CCD Sampling

• Equation Summary

• Back Matter